Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons

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United States of America Patent

PATENT NO 9915626
SERIAL NO

14633020

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over a range of low-atomic-mass materials, and to detect and identify content of a volume of interest (VOI) exposed to cosmic-ray charged particles based on the constructed scattering and stopping relationship. In one aspect, a process for constructing a scattering-stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles is disclosed. This technique first determines a scattering parameter and a stopping parameter for each material within the range of low-density materials exposed to charged particles from cosmic ray. The technique then establishes a scattering-stopping relationship of cosmic ray charged particles for the range of low-density materials based on the determined pairs of scattering and stopping parameters associated with the range of low-density materials.

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Patent Owner(s)

Patent OwnerAddress
DECISION SCIENCES INTERNATIONAL CORPORATION12345 FIRST AMERICAN WAY SUITE 130 POWAY CA 92064

International Classification(s)

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  • 2015 Application Filing Year
  • G01N Class
  • 11310 Applications Filed
  • 8345 Patents Issued To-Date
  • 73.79 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances201520162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Blanpied, Gary Ramona, US 7 87
Dorroh, Dustin Ramona, US 8 29
Kumar, Sankaran San Marcos, US 18 621
Morgan, Craig El Cajon, US 5 75
Sossong, Michael James Ramona, US 21 213

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  • 1 Citation Count
  • G01N Class
  • 40.30 % this patent is cited more than
  • 7 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges28583658330822943412011104601 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +01000200030004000250500750125015001750225025002750325035003750

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