Method and a device for surface determination by means of microwaves
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United States of America Patent
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Mar 13, 2018
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app pub date -
Jan 23, 2014
filing date -
Jan 30, 2013
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Abstract
An apparatus comprises: (1) measuring unit configured to transmit a signal towards the object and to determine a plurality of voxels, each comprising phase and magnitude of a reflected signal and spatial coordinates (comprising Z-axis, X-axis and Y-axis), and the voxels comprise a plurality of series of voxels along the Z-axis, each having a same X-coordinate and a same Y-coordinate; and (2) surface-determining unit comprising (a) magnitude unit configured to determine a maximum magnitude voxel for each series of voxels, (b) phase unit configured to determine, for each maximum magnitude voxel, phases of at least three voxels (maximum magnitude voxel and voxels adjacent thereto), (c) angle unit configured to determine, for each maximum magnitude voxel, a normal vector based on the respective phases, and (d) reconstructing unit configured to determine the object surface based on the spatial coordinates of the maximum magnitude voxels and the respective normal vectors.
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