Restoring ECC syndrome in non-volatile memory devices
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United States of America Patent
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Mar 6, 2018
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Jul 14, 2015
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Apr 11, 2013
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Abstract
A method of restoring an ECC syndrome in a non-volatile memory device having memory cells arranged in a plurality of sectors within a memory cell array, the method comprising identifying a first sector including at least one page having a disabled ECC (error correction code) flag; reading the value of all data bits in said at least one page; calculating values for ECC bits in said at least one page; and writing said data bit values and said calculated ECC bit values to a second sector in the memory cell array.
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