Integrated circuit and method for detecting a stress condition in the integrated circuit
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United States of America Patent
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Mar 6, 2018
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app pub date -
Mar 14, 2016
filing date -
Mar 14, 2016
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Abstract
An integrated circuit includes at least one first magnetic field sensing element including at least one first magnetoresistance element configured to provide an output signal of the integrated circuit in response to a detected magnetic field. The integrated circuit also includes at least one second magnetic field sensing element including at least one second magnetoresistance element configured to have a characteristic indicative of a stress condition. A method for detecting a stress condition in an integrated circuit is also provided.
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