Introducing hydrogen gas to an ICP instrument for enhanced detection of low-sensitivity elements
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United States of America Patent
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Mar 6, 2018
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Dec 28, 2012
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Dec 30, 2011
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Abstract
A method for detecting material in a sample using an ICP instrument includes preparing the sample for analysis by the ICP instrument using hydrogen gas. For example, hydrogen gas can be generated by initiating a hydride generation reaction with the sample. Further, hydrogen gas can be introduced to a component part of the sample. For instance, hydrogen gas can be added to an injector gas in a spray chamber of the ICP instrument.
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