System and method for patch based inspection
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United States of America Patent
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Feb 27, 2018
Issued Date -
N/A
app pub date -
Dec 9, 2015
filing date -
Dec 9, 2015
priority date (Note) -
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status (Latency Note)
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Abstract
An inspection system that may include a processor and a memory module; wherein the memory module is configured to store a first image of an area of an object and a second image of the area of the object; wherein the processor is configured to generate a synthetic image of the area of the object, and to compare the synthetic image to the second image to provide defect detection results.
First Claim
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Cited Art Landscape
Patent Citation Ranking
- 2 Citation Count
- G06T Class
- 22.86 % this patent is cited more than
- 7 Age
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