Probe card and test equipment with the same
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United States of America Patent
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-
Feb 27, 2018
Issued Date -
N/A
app pub date -
Aug 13, 2015
filing date -
Aug 13, 2014
priority date (Note) -
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status (Latency Note)
Importance
Abstract
A probe card for contacting an LED chip of flip-chip type includes a circuit board, two probes and a fixing seat. The circuit board has a mounting surface and a lateral edge. Each probe has a connecting portion mounted on the circuit board, an extending portion extending from the connecting portion, a cantilever portion connected with the extending portion and protruding out of the lateral edge, and a contacting portion extending from the cantilever portion. The fixing seat is mounted on the mounting surface of the circuit board and has a fixing surface. A part of the extending portion is located between the circuit board and the fixing seat. A test equipment for testing optical characteristics of an LED chip of flip-chip type is provided with the probe card.
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