Photothermal examination method and corresponding examination unit

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United States of America Patent

PATENT NO 9903828
SERIAL NO

15306949

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Abstract

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A photothermal examination method and corresponding examination unit are provided. In the method first and second zones of the surface to be characterized are scanned simultaneously, and first and second photosensitive surfaces separate from one another acquire images of the infrared radiation emitted by these two zones.

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Patent Owner(s)

Patent OwnerAddress
AREVA NPKOLB WATT FRANCE COURBEVOIE HAUTS-DE-SEINE

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Caulier, Yannick Chalon sur Saone, FR 5 10
Taglione, Matthieu Dijon, FR 5 21

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