Method and device for providing an indication of the reliability of a process parameter value to a host system
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Feb 27, 2018
Issued Date -
N/A
app pub date -
May 26, 2011
filing date -
May 26, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A field device for determining a process parameter value, comprising a measurement device for determining a process parameter value; circuitry for determining the reliability of the process parameter value; and signaling circuitry for providing the process parameter value and an indication of the reliability of the process parameter value to a host system via a current loop. The signaling circuitry is configurable between a first state in which the indication of the reliability is provided as a digital signal and the process parameter value is provided as an analog DC-value, and a second state in which the indication of the reliability is provided as a predetermined analog DC-value. Hereby, the number of unplanned process interruptions may be reduced when the host system is capable of receiving digital signals.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully