Probe alignment fixture and method
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United States of America Patent
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Feb 27, 2018
Issued Date -
N/A
app pub date -
Jan 4, 2016
filing date -
Jan 7, 2015
priority date (Note) -
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Abstract
A fixture enables a stylus extension to be angularly aligned relative to an adapter plate that mounts onto a CMM probe head. Alignment may be carried out on a flat surface remotely from the CMM. The adapter plate is mounted to the fixture, which includes an access hole providing access to adjustment screws at the rear of the adapter plate. One or more lateral extensions are connected to the stylus extension to define a calibration axis perpendicular to a probe axis of the stylus extension and perpendicular to a central axis of the adapter plate about which angular alignment is desired. Angular adjustments of the stylus extension are made while the adapter plate is mounted to the fixture, and a degree to which the calibration axis is parallel to a plane of the flat surface is detected, for example using a dial indicator engaging points on the lateral extension(s).
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