Systems and methods for multiple species atom interferometry
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Feb 20, 2018
Issued Date -
N/A
app pub date -
Oct 21, 2015
filing date -
Oct 31, 2014
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An inertial measurement apparatus based on atom interferometry. In one example, the inertial measurement apparatus includes a vacuum chamber, first and second atom capture sites housed within the vacuum chamber, each of the first and second atom capture sites being selectively configured to trap and cool first and second atom samples of distinct atom species, an atom interferometry region disposed between the first and second atom capture sites, and first and second atom interferometers operating in the atom interferometry region, the first atom interferometer being configured to generate a first measurement corresponding to a common inertial input based on the first atom sample, and the second atom interferometer being configured to generate a second measurement corresponding to the same common inertial input based on the second atom sample.
First Claim
Other Claims data not available
Family
International Classification(s)
- 2015 Application Filing Year
- G01P Class
- 782 Applications Filed
- 557 Patents Issued To-Date
- 71.23 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 2 Citation Count
- G01P Class
- 18.75 % this patent is cited more than
- 7 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Aug 20, 2025 |
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Aug 20, 2029 |
