Method of manufacturing semiconductor device, method of cleaning interior of process chamber, substrate processing apparatus, and recording medium

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United States of America Patent

PATENT NO 9895727
SERIAL NO

15272844

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Abstract

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A method of manufacturing a semiconductor device is disclosed. The method includes processing a substrate by supplying a process gas to the substrate in a process chamber. The method further includes performing a purge to an interior of the process chamber while periodically changing an internal pressure of the process chamber based on a pressure width by setting a process of supplying a purge gas into the process chamber to increase the internal pressure of the process chamber and a process of vacuum-exhausting an interior of the process chamber to decrease the internal pressure of the process chamber to one cycle and repeating the cycle a plurality of times.

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Patent Owner(s)

Patent OwnerAddress
KOKUSAI ELECTRIC CORPORATION3-4 KANDAKAJI-CHO CHIYODA-KU TOKYO 101-0045

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Asai, Masayuki Toyama, JP 35 2508
Minami, Masayoshi Toyama, JP 25 532
Nakamura, Yoshinobu Toyama, JP 112 1690
Okuda, Kazuyuki Toyama, JP 60 2300
Urano, Yuji Toyama, JP 18 438

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