System for improving probability of transient event detection
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United States of America Patent
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Feb 6, 2018
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Jul 26, 2012
filing date -
Jul 26, 2012
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Abstract
A test and measurement instrument provides for increased transient event detection by adjusting data sampling periods. The test and measurement instrument includes a data sampler for acquiring first sampled data and a data processor structured to process the first sampled data. The data processor operates during a first data processing period. Also included in the instrument is a sample time adjustor structured to allow a user to select a time for the data sampler to acquire second sampled data. The time for the data sampler to acquire the second sampled data occurs during the first data processing period. The time for acquiring the second sampled data may be determined by generating a probability distribution function, then applying the distribution function to the available times during the first data processing period that the second sample data may be collected. Methods of use of the test and measurement instrument are also provided.
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