Method and apparatus for detecting defect in transparent body
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United States of America Patent
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Feb 6, 2018
Issued Date -
N/A
app pub date -
Mar 29, 2017
filing date -
Apr 26, 2016
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A quantitative, high-sensitivity examination of defects in a transparent product is realized, using a low-cost and space-saving optical dimension measuring apparatus to carry out measurement in a non-contact manner to avoid damaging the object of inspection and to avoid sensory examination. A transparent body to be examined is disposed between a light emitting unit and a light-receiving unit arranged opposite each other. A change in an optical path caused by a defect in the transparent body is detected based on a change in a light ray emitted from the light emitting unit and being incident on the light-receiving unit after passing through the transparent body and a light-blocking object disposed between the transparent body and the light-receiving unit.
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| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Aug 6, 2025 |
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