Coherence measuring device for spin-polarized electron beam and method using the same
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United States of America Patent
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Jan 30, 2018
Issued Date -
N/A
app pub date -
Sep 28, 2015
filing date -
Oct 9, 2014
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Abstract
A path of a spin-polarized electron beam is split into two by a splitter. A spin direction of the spin-polarized electron beam is rotated by a spin direction rotator disposed on a first path, and delayed by a first delay device. On a second path, the electron beam passes through a sample stage. The spin-polarized electron beams split into the first path and the second path are superposed by a biprism, and its intensity distribution is measured. Coherence is measured from a relation between a spin direction rotation angle, a delay time, and a visibility of an interference fringe.
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Patent Citation Ranking
- 1 Citation Count
- H01J Class
- 31.16 % this patent is cited more than
- 7 Age
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