Adapter tip and microscope system for inspection of fiber-optic connector endface
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United States of America Patent
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Jan 30, 2018
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app pub date -
May 20, 2016
filing date -
May 21, 2015
priority date (Note) -
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Abstract
There is provided an adapter tip to be employed with an optical-fiber inspection microscope probe and an optical-fiber inspection microscope system suitable for imaging the optical-fiber endface of an angled-polished optical-fiber connector deeply recessed within a connector adapter. The adapter tip or microscope system comprises a relay lens system having at least a first relay lens which is disposed so as to directly receive light reflected from the optical-fiber endface during inspection, the lens axis of the first relay lens being offset relative to the optical-fiber endface so as to deviate light reflected from the optical-fiber endface towards the optical-fiber axis of the connector.
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