X-ray imaging system and method
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United States of America Patent
Stats
-
Jan 30, 2018
Issued Date -
N/A
app pub date -
Aug 8, 2016
filing date -
Apr 1, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
An X-ray imaging system can include an X-ray source that projects a beam of X-ray radiation and an X-ray detector positioned to receive the beam of X-ray radiation at a location. The X-ray detector can include: (i) a monolithic substrate having a first side and a second side opposite the first side, (ii) a scintillation layer arranged upon the first side and including a first region and a second region, the first region having a first X-ray sensitivity and the second region having a second X-ray sensitivity different than the first X-ray sensitivity, and (iii) a photosensor array arranged upon the second side. The X-ray source and X-ray detector can be configured to adjust the location at which the X-ray detector receives the beam of X-ray radiation such that the location is primarily within the first region or the second region.
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International Classification(s)
- 2016 Application Filing Year
- A61B Class
- 18399 Applications Filed
- 13681 Patents Issued To-Date
- 74.36 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 0 Citation Count
- A61B Class
- 0 % this patent is cited more than
- 7 Age
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