Test device and imaging device including the same

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United States of America Patent

PATENT NO 9880270
SERIAL NO

14883753

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Abstract

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A test device includes a plurality of transceivers that respectively transmit a wave to a test target point of a test object, respectively receive a wave reflected, scattered, or refracted from the test object, and respectively output a signal generated in response to the received wave; a combiner that combines the plurality of received signals generated by the plurality of transceivers; and a plurality of switches that are opened or closed to transfer the plurality of received signals to the combiner or block the plurality of received signals from being transferred to the combiner.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hayashi, Yoshihiko Seongnam-si, KR 45 899
Kim, Jae-hong Seoul, KR 196 1682
Okubo, Akinori Hwaseong-si, KR 17 14

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