Method of calibrating and debugging testing system
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United States of America Patent
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Jan 30, 2018
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N/A
app pub date -
Jan 9, 2017
filing date -
Dec 13, 2013
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Abstract
A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of the electrical path segments are calibrated again to compare the current parameters to the previously saved parameters. The component which goes wrong can be found out quickly in this way.
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