Measurement of bonding resistances
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jan 30, 2018
Issued Date -
N/A
app pub date -
Dec 30, 2014
filing date -
Jan 10, 2014
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
Disclosed is a method for determining a contact resistance of an H bridge including four transistors, each transistor having a point of connection to two neighboring transistors, a bond being produced in each case between a connection point lying between two transistors and an access terminal. The method includes: acting on the open/closed state of the transistors of the bridge so that the transistors on either side of the connection point corresponding to the access terminal are open; applying a determined voltage to an access terminal; determining the current flowing through the bond corresponding to the access terminal; grounding an access terminal neighboring the access terminal if this neighboring access terminal is not already connected to ground; and measuring the voltage at the other neighboring access terminal.
First Claim
Other Claims data not available
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
- 0 Citation Count
- G01R Class
- 0 % this patent is cited more than
- 7 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Jul 30, 2025 |
| 11.5 Year Payment | $7400.00 | $3700.00 | $1850.00 | Jul 30, 2029 |
