Method and apparatus for spatially resolved diagnosis
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United States of America Patent
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Jan 30, 2018
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app pub date -
Apr 10, 2015
filing date -
Apr 11, 2014
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Abstract
A method and device for diagnosing an electrical condition of a spatially extended hardware component in a spatially resolved manner via interference between pulses fed into the component by a signal generator. The method includes: feeding at least two pulses into the component offset by a pulse interval; detecting the interfered pulses and echoes via an analysis unit; varying the pulse interval for the spatially resolved scanning of the hardware component along its length; repeating the steps until the component has been scanned at least in some sections; and analyzing the detected interfered pulses in the analysis unit. The device includes at least one signal generator connected to the component and to an analysis unit to generate the pulses, wherein local energy losses are mathematically determined over the length of the component on the basis of a plurality of interference voltage waveforms and voltage waveforms induced by the pulses.
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