Scanner system and method for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test
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United States of America Patent
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Jan 30, 2018
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app pub date -
Jan 29, 2015
filing date -
Jan 30, 2014
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Abstract
A scanner system and method operable for high-resolution spatial scanning of an electromagnetic field radiated by an electronic device under test (DUT) are provided. The electromagnetic field level radiated by the DUT is measured with a probe array comprising a plurality of spatially separated switched probes, an analyzer, and a computer. An actuator changes the relative position of the probe array to the DUT by a distance less than or equal to the separation distance between the probes, and the electromagnetic field level is measured and stored again.
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