Probe alignment connection device
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United States of America Patent
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Jan 30, 2018
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N/A
app pub date -
Aug 21, 2014
filing date -
Aug 21, 2014
priority date (Note) -
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Abstract
A probe for automatic test equipment (ATE) includes: an outer shroud including a course alignment feature configured to receive a target device and to guide the target device into an interior of the outer shroud, where the target device includes exposed electrical leads; and an inner structure that is at least partly inside the outer shroud. The inner structure includes electrical contacts for making an electrical connection to the exposed electrical leads, and also includes a fine alignment feature configured to guide the target device towards the electrical contacts to make the electrical connection.
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