Method for characterizing a material
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United States of America Patent
Stats
-
Jan 30, 2018
Issued Date -
N/A
app pub date -
Oct 21, 2011
filing date -
Oct 21, 2011
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A method for characterizing a material, comprising: arranging a piece of the material near a source of ionizing photons and a detector; irradiating the piece with photons and acquiring, via the detector, two energy spectra of a photon flux that has been diffused into the material at various depths, the ratio of the photon paths in the material before and after diffusion remaining constant; determining a combined attenuation function with the spectra and the paths; selecting a plurality of energy ranges from said function; calculating, in each range, a quantity that is representative of the function; and estimating, from at least two of said quantities, a physical characteristic of the material by comparison with the same quantities obtained from known materials.
First Claim
Other Claims data not available
Family
International Classification(s)
- 2011 Application Filing Year
- G01N Class
- 6853 Applications Filed
- 5223 Patents Issued To-Date
- 76.22 % Issued To-Date
Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01N Class
- 40.30 % this patent is cited more than
- 7 Age
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|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Jul 30, 2025 |
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