Heterodyne grating interferometer displacement measurement system
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United States of America Patent
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Jan 30, 2018
Issued Date -
N/A
app pub date -
Oct 28, 2013
filing date -
Nov 9, 2012
priority date (Note) -
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status (Latency Note)
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Abstract
A displacement measurement system of heterodyne grating interferometer, comprises a reading head, a measurement grating and an electronic signal processing component. Laser light emitted from the laser tube is collimated, passes through the first polarization spectroscope, and then emits two light beams with an orthogonal polarization direction and an orthogonal propagation direction; the two light beams pass through two acousto-optic modulators and respectively generate two first-order diffraction light beams with different frequencies, which are later divided into reference light and measurement light; two parallel reference light beams form a beat frequency electric signal with positive and negative first-order diffraction measurement light respectively after passing through a measurement signal photo-electric conversion unit; the beat frequency signals are transmitted to the electronic signal processing component for signal processing, thus the output of linear displacement in two directions is realized.
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- 2 Citation Count
- G01B Class
- 21.98 % this patent is cited more than
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