Component measurement system having wavelength filtering
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United States of America Patent
Stats
-
Jan 30, 2018
Issued Date -
N/A
app pub date -
May 11, 2015
filing date -
Oct 23, 2014
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A system is disclosed for measuring a feature of a component. The system may have a probe with a tip, and a sensing element configured to generate signals associated with a proximity of the tip to the feature. The system may also have an actuator configured to move the probe relative to the component, and a controller in communication with the sensing element and the actuator. The controller may be configured to generate a deviation report based on the signals, and to filter information from the deviation report according to wavelength into a plurality of deviation categories corresponding to specification requirements of the component. The plurality of deviation categories may include at least a waviness category. The controller may also be configured to determine a change to a process used to fabricate the component based on the information from the deviation report filtered into the waviness category.
First Claim
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Cited Art Landscape
Patent Citation Ranking
- 1 Citation Count
- G01B Class
- 21.98 % this patent is cited more than
- 7 Age
Maintenance Fees
| Fee | Large entity fee | small entity fee | micro entity fee | due date |
|---|---|---|---|---|
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | Jul 30, 2025 |
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