Multi-chip package, system and test method thereof
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United States of America Patent
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Jan 23, 2018
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app pub date -
Feb 18, 2016
filing date -
Sep 18, 2015
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Abstract
A multi-chip package may include a plurality of semiconductor chips integrated in a single package and sharing one or more command pins. Each of the semiconductor chips may include: a command decoder suitable for decoding a command to generate a buffer enable signal, a mode enable signal, and a mode signal; a data input buffer suitable for buffering data to output internal data, in response to the buffer enable signal and a common test mode signal; a command controller suitable for receiving the mode enable signal to output a test mode enable signal by selectively blocking the mode enable signal based on the internal data and the common test mode signal; and a test controller suitable for generating the common test mode signal and a test mode signal, based on the test mode enable signal and the mode signal.
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