METHOD FOR PLANARIZING MATERIAL LAYER

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United States of America Patent

SERIAL NO

15220365

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Abstract

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A method for planarizing a silicon layer includes providing a silicon layer having at least one recess therein. Next, a photoresist layer is formed to cover the silicon layer and fill up the recess. Then, the photoresist layer is hardened. After that, part of the photoresist layer is removed by taking a top surface of the silicon layer as a stop layer. Finally the photoresist layer and the silicon layer are etched back simultaneously to remove the photoresist layer entirely.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPNO 3 LI-HSIN ROAD 2 SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU CITY

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hsu, Li-Chieh Taichung City, TW 26 72
Huang, Po-Cheng Kaohsiung City, TW 64 300
Li, Kun-Ju Tainan City, TW 51 75
Li, Yu-Ting Chiayi City, TW 37 177
Lin, Chien-Nan Tainan City, TW 40 125
Liu, Yi-Liang Tainan City, TW 13 51
Tsai, Fu-Shou Keelung City, TW 23 39

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