Method and apparatus for using programmable logic circuitry to test on-chip analog-to-digital converter
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United States of America Patent
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Jan 23, 2018
Issued Date -
N/A
app pub date -
Mar 24, 2016
filing date -
Mar 24, 2016
priority date (Note) -
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Abstract
The present invention discloses a method of testing an analog-to-digital converter (ADC). The method includes receiving a series of analog signals from a tester site, converting the series of analog signals to a series of digital code words using an ADC, evaluating the ADC based on the series of digital code words using an ADC test setup and generating an output signal identifying whether the ADC has passed the testing.
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Cited Art Landscape
Patent Citation Ranking
- 3 Citation Count
- G06F Class
- 20.77 % this patent is cited more than
- 7 Age
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