Method and apparatus for automated surge stress testing of a device under test using voltage and current waveforms
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United States of America Patent
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Jan 23, 2018
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app pub date -
Nov 12, 2015
filing date -
Nov 12, 2015
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Abstract
Surge testing systems and methods to surge test a device under test (DUT) in which a host computer controls a pulse generator and an oscilloscope to automatically apply a high voltage pulse from the pulse generator through a current limiter to the DUT, the oscilloscope provides one or more current or voltage waveforms representing a voltage or current associated with the DUT and/or the pulse generator, and the host computer determines a pass or fail condition of the DUT for the applied high voltage pulse according to the waveform or waveforms.
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