Position-measuring system, having scanning units multiplexed to light sources and detectors, for optically scanning a measuring standard and method for operating such a position-measuring system

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United States of America Patent

PATENT NO 9874434
SERIAL NO

14565614

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Abstract

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A position-measuring system includes a plurality of scanning units for the optical scanning of at least one measuring standard, the scanning units being coupled optically to a plurality of light sources and a plurality of detectors. Disposed between the scanning units and the detectors are a plurality of demultiplexers, via which in each case at least two scanning units are coupled to one detector.

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Patent Owner(s)

Patent OwnerAddress
DR JOHANNES HEIDENHAIN GMBHDR -JOHANNES-HEIDENHAIN-STR 5 TRAUNREUT 83301

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Holzapfel, Wolfgang Obing, DE 125 1123

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