Semiconductor device and manufacturing method thereof

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United States of America Patent

PATENT NO 9871101
SERIAL NO

14488082

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Abstract

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A semiconductor structure, and methods for forming the semiconductor device are provided. In various embodiments, the semiconductor device includes a substrate, source/drain regions over the substrate, a plurality of nanowires over the substrate and sandwiched by the source/drain regions, a gate dielectric layer surrounding the plurality of nanowires, and a gate layer surrounding the gate dielectric layer.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD8 LI-HSIN RD 6 HSINCHU SCIENCE PARK HSINCHU 300-78

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Diaz, Carlos H Mountain View, US 267 4411
Doornbos, Gerben Leuven, BE 198 1210
Lin, Chun-Hsiung Zhubei, TW 118 1300
Wang, Chien-Hsun Hsinchu, TW 50 887

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