Formation method of semiconductor device structure

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United States of America Patent

PATENT NO 9870955
SERIAL NO

15456735

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Abstract

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A method for forming a semiconductor device structure is provided. The method includes forming a gate stack over a semiconductor substrate and forming a dummy shielding layer over the semiconductor substrate and the gate stack. The method also includes forming source and drain features near the gate stack after the dummy shielding layer is formed. The method further includes removing the dummy shielding layer after the source and drain features are formed such that substantially no dummy shielding layer remains on the source and drain features.

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Patent Owner(s)

  • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chang, Che-Cheng New Taipei, TW 409 2774
Chang, Yung-Jung Hsinchu County, TW 35 344
Chen, Yi-Jen Hsinchu, TW 99 605

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