Ion source for mass spectrometry
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United States of America Patent
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Jan 16, 2018
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app pub date -
Oct 31, 2014
filing date -
Dec 20, 2013
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Abstract
Systems and methods for delivering a sample to a mass spectrometer are provided. In one aspect, the systems and methods can provide efficient cooling of an ion source probe to prevent overheating and the resulting degradation in ion sampling. In some aspects, such cooling can result in improved consistency and/or efficiency of ion formation. Moreover, ion source cooling in accordance with various aspects of the present teachings can allow for the use of higher temperatures in the ionization chamber (thereby improving desolvation) and/or can enable the use of lower flow rate sample sources than with conventional techniques.
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