Measuring device for property of photovoltaic device and measuring method using the same

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United States of America Patent

PATENT NO 9866171
SERIAL NO

14965893

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Abstract

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A measuring device for the property of a photovoltaic device and a measuring method using the same are provided. The measuring device includes several light sources and a feedback control module. The light color of each light source is different and includes several light-emitting elements symmetrically configured. The feedback control module is used for controlling illuminations of the light-emitting elements for measuring the property of a photovoltaic device.

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Patent Owner(s)

Patent OwnerAddress
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE195 SEC 4 CHUNG HSING RD CHUTUNG HSINCHU 310401

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hsu, Shu-Tsung Hsinchu, TW 4 24
Long, Yean-San Hsinchu, TW 5 5
Tsai, Min-An Baozhong Township, Yunlin County, TW 3 1
Wu, Teng-Chun Jinning Township, Kinmen County, TW 16 73

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