Semiconductor memory cell, semiconductor memory device, and method of manufacturing semiconductor memory device

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United States of America Patent

PATENT NO 9865693
SERIAL NO

15227986

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Abstract

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A semiconductor memory device and a semiconductor memory cell thereof are provided. The semiconductor memory device includes a plurality of semiconductor memory cells and an electric isolating structure. Each semiconductor memory cell includes a substrate, a first gate, a second gate, a first gate dielectric layer, a second gate dielectric layer, and a first spacing film. The first gate and the second gate are formed on the substrate. The first gate dielectric layer is between the first gate and the substrate, whereas the second gate dielectric layer is between the second gate and the substrate. The first spacing film having a side and a top edge is between the first gate and the second gate. The second gate covers the side and the top edge. Additionally, a method of manufacturing the semiconductor memory device is also provided.

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Patent Owner(s)

Patent OwnerAddress
UNITED MICROELECTRONICS CORPORATIONNO 3 LI-HSIN RD II SCIENCE-BASED INDUSTRIAL PARK HSINCHU

International Classification(s)

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  • 2016 Application Filing Year
  • H01L Class
  • 27971 Applications Filed
  • 23507 Patents Issued To-Date
  • 84.05 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances20162017201820192020202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Zhen Singapore, SG 228 1215
Liu, Weichang Singapore, SG 25 69
Ta, Wei Singapore, SG 15 24
Wang, Shen-De Zhudong Township, TW 57 189
Xiang, Wang Singapore, SG 26 96

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  • H01L Class
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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges3689997611243481558461392216162801 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +05001000150020002500300035004000450050005500600065007000750080008500900095001000010500

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