Systems and methods for testing and packaging a superconducting chip
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Jan 9, 2018
Issued Date -
N/A
app pub date -
Dec 17, 2013
filing date -
Dec 17, 2012
priority date (Note) -
In Force
status (Latency Note)
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Abstract
Superconductive interconnection structures providing continuous, uninterrupted superconducting signal paths between a superconducting chip and a superconducting chip carrier are described. The superconductive interconnection structures employ superconducting solder bumps and pillars of Under Bump Metal (“UBM”). The superconductive interconnection structures are employed in a two-stage solder bumping process in which the superconducting chip is first bonded to a testing module for screening and then bonded to a chip packaging module for operation. Either the testing module or the chip packaging module, or both, may include a multi-chip module for carrying multiple superconducting chips simultaneously.
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Family
Country | kind | publication No. | Filing Date | Type | Sub-Type |
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- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- D-WAVE SYSTEMS INC.
International Classification(s)
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
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Bunyk, Paul I | Vancouver, CA | 61 | 2310 |
# of filed Patents : 61 Total Citations : 2310 |
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- 6 Citation Count
- H01L Class
- 23.71 % this patent is cited more than
- 7 Age
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