Method and apparatus for gap fill using deposition and etch processes

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United States of America Patent

PATENT NO 9865499
SERIAL NO

15185238

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Abstract

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A method for depositing a silicon-containing film is performed by causing a silicon-containing gas to adsorb on a first surface of a depression formed in a second surface of a substrate by supplying the silicon-containing gas to the substrate. A silicon component contained in the silicon-containing gas adsorbed on the first surface of the depression is partially etched by supplying an etching gas to the substrate. A silicon-containing film is deposited in the depression by supplying a reaction gas reactable with the silicon component to the substrate so as to produce a reaction product by causing the reaction gas to react with the silicon component left in the depression without being etched.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kikuchi, Hiroyuki Iwate, JP 109 1686
Miura, Shigehiro Iwate, JP 53 431
Murata, Masahiro Iwate, JP 83 834
Sato, Jun Iwate, JP 662 10623

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges533947902612535101 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7081 - 900501001502002503003504004505005506006507007508008509009501000

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