Burn-in memory testing
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United States of America Patent
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Jan 9, 2018
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app pub date -
Oct 22, 2015
filing date -
Oct 22, 2015
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Abstract
A method performed by a controller includes initiating a first data write operation and an erase operation on a portion of a non-volatile memory. The first data write operation corresponds to a first write resolution. The method includes initiating a second data write operation to write test data to the portion of the non-volatile memory. The second data write operation corresponds to a second write resolution that is greater than the first write resolution. The method also includes reading a representation of the test data from the portion of the non-volatile memory.
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