Method for light flicker analysis and device thereof

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United States of America Patent

PATENT NO 9865044
SERIAL NO

14673881

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Abstract

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This invention provides devices and methods of determining flicker-related parameters of a light emitting source. In one embodiment, the method has the following steps: a) acquiring one or more photo images or video images of a light emitting source with an image capturing device that has a rolling shutter; b) generating, with a processor, from the photo images or video images a flicker frame having one or more flicker dark lines, wherein each flicker dark lines has an output column value of 1; and c) generating, with a processor, one or more flicker-related parameters based on the flicker frame, thereby determining the flicker-related parameters of the light emitting source.

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Patent Owner(s)

Patent OwnerAddress
HONG KONG BAPTIST UNIVERSITYHONG KONG

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lam, Ka Man Hong Kong, CN 1 3

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges2332524554514072381312563701 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +025050075010001250150017502000225025002750300032503500375040004250450047505000525055005750

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