Scheme applied into electronic device and capable of measuring resistance parameter(s) associated with battery cell

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United States of America Patent

PATENT NO 9864015
SERIAL NO

14617949

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Abstract

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A method applied into an electronic device and capable of measuring at least one resistance parameter includes: launching a program/application on the electronic device; and using the program/application to measure the at least one resistance parameter that is at least associated with a battery cell connected to and used for providing power to the electronic device.

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Patent Owner(s)

Patent OwnerAddress
MEDIATEK INCNO 1 DUSING RD 1ST SCIENCE-BASED INDUSTRIAL PARK HSIN-CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chou, Kai-Hsun New Taipei, TW 5 39
Lee, Chi-Ming Hsinchu, TW 33 251
Wu, Jui-Chi Taichung, TW 25 104

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