Circuit and method for inspecting semiconductor device
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United States of America Patent
Stats
-
Jan 9, 2018
Issued Date -
N/A
app pub date -
Jun 23, 2015
filing date -
Jun 26, 2014
priority date (Note) -
In Force
status (Latency Note)
Importance
Abstract
A circuit for inspecting a semiconductor device includes: the semiconductor device that is an object to be inspected and includes a diode; a protection element that is connected in series with the semiconductor device and includes a protection diode having higher breakdown resistance than the diode; a switch that includes a switching element connected in series with the semiconductor device and the protection element; and a coil that provides a loop path together with the semiconductor device and the protection element when the switching element is turned off. Even when the semiconductor device including the diode is broken, an inspection device is restricted from being damaged.
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- 0 % this patent is cited more than
- 7 Age
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