On-chip leakage measurement
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United States of America Patent
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Jan 9, 2018
Issued Date -
N/A
app pub date -
Mar 3, 2016
filing date -
Mar 3, 2016
priority date (Note) -
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Abstract
Method of measuring semiconductor device leakage which includes: providing a semiconductor device powered by a supply voltage and having a circuit block of transistors; providing on the semiconductor device a test circuit providing an input to a counter and a fixed-frequency measurement clock to provide a clock signal to the counter; disconnecting a system clock from the circuit block; receiving by the test circuit the supply voltage as an input; initializing the counter; starting the counter when the supply voltage is at or below a first voltage Vhigh; monitoring a decrease of the supply voltage with time; stopping the counter when the supply voltage is at or below a second voltage Vlow such that Vhigh is greater than Vlow; and reading the counter to provide the semiconductor device leakage metric. Also disclosed is an apparatus and a computer program product.
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