Sample analyzer, sample analyzing method, and program determining data end points used to calculate target material concentration

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United States of America Patent

PATENT NO 9863964
APP PUB NO 20160327582A1
SERIAL NO

15142905

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Abstract

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Disclosed is a sample analyzer configured to analyze a concentration of a target material contained in a sample based on a value representing a slope of a regression line which is based on data values included in an interval from a start point to an endpoint. The start point is detected by a predetermined method and the endpoint is detected by a predetermined method.

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Patent Owner(s)

Patent OwnerAddress
SYSMEX CORPORATION5-1 WAKINOHAMA-KAIGANDORI 1-CHOME CHUO-KU KOBE-SHI HYOGO 651-0073

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Koshimura, Naoto Kobe, JP 5 6

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