Method of inspecting sapphire structures and method of forming the same
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United States of America Patent
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Jan 9, 2018
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app pub date -
Feb 7, 2014
filing date -
Feb 7, 2014
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Abstract
A method of inspecting and forming sapphire structures. The method of inspecting a sapphire structure may include providing an annealed sapphire structure, and measuring a profile of at least a portion of the annealed sapphire structure. The profile of at least the portion of the annealed sapphire structure may be measured using a non-x-ray based measuring device. Additionally, the method of inspecting may include identifying a defect within at least a portion of the measured profile of the annealed sapphire structure.
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