Method for imaging nanostructures with optical microscopy
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United States of America Patent
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Jan 9, 2018
Grant Date -
Jul 30, 2015
app pub date -
Jan 23, 2015
filing date -
Jan 25, 2014
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Abstract
A method for observing nanostructures by optical microscopy is provided. Firstly, a sample with a nanostructure and a vapor-condensation-assisted optical microscopy system are provided. The vapor-condensation-assisted optical microscopy system comprises a vapor-condensation-assisted device and an optical microscope comprising a stage. The vapor-condensation-assisted device is used to provide a vapor to sample on the stage in application. Secondly, locating the sample is located on the stage. Thirdly, a vapor is applied to the sample to observe the sample via the optical microscopy system.
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