Correction of a temperature measurement of a thermometric resistance-type temperature probe
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United States of America Patent
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Jan 9, 2018
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app pub date -
Apr 23, 2013
filing date -
Apr 23, 2012
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Abstract
The invention relates to a temperature measurement method using a thermometric resistance-type temperature probe (1) comprising at least two electroconductive sensitive elements (3, 4) on the same substrate (2), wherein different parameters representative of the strength of the electric current circulating in one of said sensitive elements (3, 4) are measured, and a correction, according to said strength of the electric current circulating in said sensitive element (3, 4), is applied to a signal representative of a temperature measurement generated from the other one of said sensitive elements (3, 4), in order to correct an error created as a result of the self-heating by the Joule effect of said sensitive element (3, 4) affecting the other one of said sensitive elements (3, 4).
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