Poly(thioaminal) probe based lithography

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United States of America Patent

PATENT NO 9862802
SERIAL NO

14954398

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Abstract

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Methods and materials for patterning a substrate are disclosed herein. A poly(thioaminal) material may be utilized as a thermal resist material for patterning substrates in a thermal scanning probe lithography process. The poly(thioaminal) material may be functionalized with an electron withdrawing group and various monomers may be volatilized upon exposure to a thermal scanning probe.

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Patent Owner(s)

Patent OwnerAddress
INTERNATIONAL BUSINESS MACHINES CORPORATIONNEW ORCHARD ROAD ARMONK NY 10504

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Boday, Dylan J Austin, US 268 1441
Garcia, Jeannette M San Leandro, US 123 397
Hedrick, James L Pleasanton, US 297 1330
Wojtecki, Rudy J San Jose, US 160 810

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