System and method for determining a quality value of a location estimation of equipment
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United States of America Patent
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Jan 9, 2018
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N/A
app pub date -
Dec 3, 2014
filing date -
Mar 13, 2008
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Abstract
A system is provided for determining a quality of a location estimation of a powered system at a location. The system includes a first sensor configured to measure a first parameter of the powered system at the location. The system further includes a second sensor configured to measure a second parameter of the powered system at the location. The system further includes a second controller configured to determine the location estimation of the powered system and the quality of the location estimation, based upon a first location of the powered system based on the first parameter, and a second location of the powered system based on the second parameter of the powered system. A method is also provided for determining a quality of a location estimation of a powered system at a location.
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