Estimating deformation of a patterning device and/or a change in its position
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United States of America Patent
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-
Jan 2, 2018
Issued Date -
N/A
app pub date -
Mar 5, 2015
filing date -
Apr 28, 2014
priority date (Note) -
In Force
status (Latency Note)
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Abstract
A system and method are provided for determining deformation of a patterning device and/or shift position of the patterning device relative. The system includes a first sensing sub-system that measures respective positions of a plurality of reference marks on the patterning device, and a second sensing sub-system that measures positions of the edge of the patterning device relative to the support. The system further includes a controller to determine an absolute position of the patterned portion and change in the absolute position based on measured respective positions of marks on the patterning device, determine a change in a relative position of the edge of the patterned device based on the measured edge positions, and estimate a change in a position of the patterning device relative to the support and a change in a pattern distortion of the patterned portion of the patterning device over a time period.
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